Confocal Fluorescence Microscopy
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A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
Published on: May 30, 2016
Dongli Xu1,2, Jun Ding2, Leilei Peng1,3
1College of Optical Sciences, The University of Arizona, Tucson, Arizona, USA.
This study introduces a new method to correct pattern distortions in structured illumination microscopy (SIM) images. The technique enhances super-resolution imaging in challenging biological samples, even with low signal and scattering.
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