Talbot-Lau interferometry-based x-ray imaging system with retractable and rotatable gratings for nondestructive

N Morimoto1, K Kimura1, T Shirai1

  • 1Radiation Technology Unit, Technology Research Laboratory, Shimadzu Corporation, 3-9-4 Hikaridai, Seika-cho, Soraku-gun, 619-0237 Kyoto, Japan.

Summary

This study introduces an advanced X-ray imaging system for versatile material characterization. The system effectively visualizes microcracks and fiber orientations in carbon fiber reinforced plastics using dark-field imaging.