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    Backside Absorbing Layer Microscopy (BALM) offers high-resolution surface imaging. This study reveals a universal relationship linking sample reflectivity to physical thickness, enabling quantitative measurements independent of instrument settings or refractive index.

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    Area of Science:

    • Optics and Photonics
    • Materials Science
    • Surface Imaging Techniques

    Background:

    • Backside Absorbing Layer Microscopy (BALM) is a novel surface imaging technique.
    • BALM exhibits high sensitivity and lateral resolution, promising for imaging sensor development.
    • Quantitative analysis of BALM images is needed for practical applications.

    Purpose of the Study:

    • To establish a method for quantitative analysis of BALM images.
    • To develop a universal relationship between sample reflectivity and physical thickness.
    • To enable accurate mapping of physical sample thickness.

    Main Methods:

    • Demonstration of a universal relationship between sample reflectivity and physical thickness.
    • Identification of three measurable quantities governing this relationship.
    • Application of the derived relationship to BALM image analysis.

    Main Results:

    • A universal relationship between sample reflectivity and physical thickness was established.
    • Physical sample thickness mapping is achievable irrespective of instrument settings.
    • The method is independent of the sample's refractive index.

    Conclusions:

    • BALM images can be quantitatively analyzed to determine physical sample thickness.
    • This breakthrough simplifies BALM data interpretation and broadens its applicability.
    • The technique shows potential for kinetic measurements and advanced imaging sensor development.