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Updated: Dec 27, 2025

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
Terahertz imaging combined with a novel convolutional neural network (CNN) improves integrated circuit (IC) defect detection. This nondestructive method offers a faster, more accurate alternative to traditional techniques for IC manufacturing quality control.
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