3D LIDAR imaging using Ge-on-Si single-photon avalanche diode detectors

Area of Science:

• Photonics
• Optical Engineering
• Infrared Technology

Background:

• Advancements in single-photon avalanche diode (SPAD) technology enable new sensing capabilities.
• Short-wavelength infrared (SWIR) imaging offers advantages for certain applications.
• LIDAR systems require efficient detectors for accurate depth and intensity mapping.

Purpose of the Study:

• To develop and demonstrate a scanning LIDAR system utilizing a Ge-on-Si SPAD detector.
• To achieve depth and intensity imaging in the SWIR region.
• To evaluate the system's performance and predict its capabilities at longer ranges.

Main Methods:

• Integration of an individual Ge-on-Si SPAD detector into a scanning LIDAR system.
• Application of time-correlated single-photon counting (TCSPC) for time-of-flight measurements.
• Utilizing advanced image processing algorithms for single-photon data analysis.

Main Results:

• Successful laboratory demonstrations of depth and intensity reconstructions for short-range targets.
• Development of algorithms tailored for SWIR single-photon LIDAR data.
• Prediction of sub-milliwatt average power requirements for kilometer-range measurements.

Conclusions:

• The developed Ge-on-Si SPAD LIDAR system is effective for SWIR depth and intensity imaging.
• The system shows promise for long-range sensing applications with low power consumption.
• Further development could enable efficient kilometer-scale depth mapping.