Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Reconstruction of 3D crystal growth from transmission optical microscopy images.

PNAS nexus·2026
Same author

Color-neutral, transparent, antimicrobial glass surface based on nanostructured Cu-Zn.

Scientific reports·2025
Same author

Indium tin oxide based lossy mode resonance fiber optic sensor for high resolution liquid-level and refractive Index sensing.

Optics express·2025
Same author

Sensitivity Enhancement of Polymer Optical Fiber Surface Plasmon Resonance Sensor Utilizing ITO Overlayer.

Sensors (Basel, Switzerland)·2025
Same author

Case Report: Androgenetic/biparental chimera with two biparental cell lines leading to placental mesenchymal dysplasia: a possible novel mechanism of formation.

Human reproduction (Oxford, England)·2025
Same author

Combined clinoptilolite and Fe(O)OH for efficient removal of Cu(II) and Pb(II) with enhanced solid-liquid separation.

Discover chemical engineering·2025

Related Experiment Video

Updated: May 21, 2026

Lensless Fluorescent Microscopy on a Chip
11:23

Lensless Fluorescent Microscopy on a Chip

Published on: August 17, 2011

18.0K

An ultra-compact particle size analyser using a CMOS image sensor and machine learning.

Rubaiya Hussain1, Mehmet Alican Noyan1,2, Getinet Woyessa3

  • 11ICFO- Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology, 08860 Castelldefels (Barcelona), Spain.

Light, Science & Applications
|March 5, 2020
PubMed
Summary

A new compact particle size analyzer uses a camera and machine learning to measure particle size, offering a low-cost alternative to traditional laser diffraction methods. This device demonstrates high accuracy, even with multiple scattering effects.

Keywords:
Imaging and sensingOptics and photonics

More Related Videos

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

10.6K
Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

8.2K

Related Experiment Videos

Last Updated: May 21, 2026

Lensless Fluorescent Microscopy on a Chip
11:23

Lensless Fluorescent Microscopy on a Chip

Published on: August 17, 2011

18.0K
Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

10.6K
Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

8.2K

Area of Science:

  • Optics and Photonics
  • Machine Learning Applications
  • Materials Science

Background:

  • Traditional laser diffraction particle size analyzers are precise but large, complex, and costly.
  • There is a need for compact, affordable particle analysis tools for diverse applications.

Purpose of the Study:

  • To introduce a novel, compact particle size analyzer utilizing consumer electronics and machine learning.
  • To validate the performance of this new device against established methods.

Main Methods:

  • Development of a collimated beam configuration with an angular spatial filter.
  • Integration of a light-emitting diode (LED) and a complementary metal-oxide-semiconductor (CMOS) image sensor.
  • Application of a machine learning model to predict volume median diameter from scattering images.
  • Validation using glass beads (13-125 µm) at various concentrations.

Main Results:

  • Accurate prediction of particle size with low mean absolute percentage errors (5.09% without concentration, 2.5% with concentration).
  • Significant reduction in error (0.72%) when analyzing only spherical particles.
  • Demonstrated ability to correct for multiple scattering effects.

Conclusions:

  • The proposed device is compact (approx. 10 cm) and built with low-cost components.
  • It offers a viable, cost-effective alternative to traditional particle size analyzers.
  • Potential applications include online and in-line industrial process monitoring outside standard laboratory settings.