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X-ray Crystallography

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Related Experiment Video

Updated: Dec 26, 2025

$Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene$

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted

Akinobu Niozu^1,2, Yoshiaki Kumagai^3,4, Toshiyuki Nishiyama^1,2

¹Department of Physics, Kyoto University, Kyoto 606-8502, Japan.

|March 10, 2020

Summary

Researchers developed a new method using X-ray scattering to analyze defects in single nanoparticles. This technique reveals detailed structural information, crucial for understanding nanoparticle properties and applications.

Keywords:

X-ray diffraction X-ray scattering XFELs angular correlations crystalline defects single nanoparticles stacking faults structure determination

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Last Updated: Dec 26, 2025

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$Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction$

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

Area of Science:

Materials Science
Nanotechnology
Condensed Matter Physics

Background:

Nanoparticle uniformity is critical for their properties and applications.
Crystalline defects significantly influence nanoparticle characteristics.
X-ray free-electron lasers (XFELs) offer high-resolution structural analysis of nanoscale matter.

Purpose of the Study:

To propose and validate a novel analysis approach for characterizing defects in single nanoparticles.
To overcome challenges in 3D structure reconstruction from randomly oriented nanoparticles.
To utilize wide-angle X-ray scattering (WAXS) data from free-flying nanoparticles.

Main Methods:

Development of an analysis method based on correlated X-ray scattering.
Conducting WAXS experiments on xenon nanoparticles at the SPring-8 Ångstrom compact free-electron laser (SACLA).
Combining kinematical diffraction theory with geometric calculations for numerical simulations.

Main Results:

Observed clear angular correlations in Bragg spots from single-shot X-ray diffraction patterns.
Demonstrated that these correlations provide significant structural information about nanoparticles.
Successfully reproduced experimental angular correlations through numerical simulations.

Conclusions:

The correlated X-ray scattering analysis method is effective for defect characterization in single nanoparticles.
Stacking faults were identified as the cause of diffuse scattering intensity in xenon clusters.
This approach enhances the understanding of nanoparticle structure and defect properties.