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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Zhihui Cai1,2, Zhangmin Jin2, Linyi Zhu1
1Institute of Process Equipment & Control Engineering, Zhejiang University of Technology, Hangzhou 310032, China.
This study improves ultrasonic testing by reanalyzing ignored data to precisely calibrate probe refraction angles. This data fusion technique enhances the accuracy of measuring flaw heights in mechanical components.
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