X-ray fluorescence detection for serial macromolecular crystallography using a JUNGFRAU pixel detector

Area of Science:

• Materials Science
• Crystallography
• Photon Science

Background:

• Traditional X-ray fluorescence detection in macromolecular crystallography (MX) relies on silicon drift detectors.
• Silicon drift detectors are unsuitable for X-ray free-electron lasers (XFELs) due to their short X-ray pulse durations.

Purpose of the Study:

• To evaluate the JUNGFRAU hybrid pixel detector for heavy element detection in MX samples.
• To assess JUNGFRAU's capability for precise fiducial positioning in serial crystallography.
• To demonstrate elemental absorption edge measurements using JUNGFRAU.

Main Methods:

• Operating the JUNGFRAU detector in a low-flux regime for X-ray fluorescence detection.
• Measuring the fluorescence signal from micrometre-sized metal marks for position determination.
• Conducting measurements at both synchrotron beamlines and SwissFEL.

Main Results:

• JUNGFRAU successfully detected heavy elements in MX samples via X-ray fluorescence in a low-flux regime.
• Precise positioning of micrometre-sized metal fiducials was demonstrated for serial crystallography.
• Elemental absorption edges were measured at a synchrotron beamline using JUNGFRAU.

Conclusions:

• The JUNGFRAU detector is a viable alternative for heavy element detection in MX, especially at XFELs.
• JUNGFRAU's capabilities extend to precise fiducial localization, enhancing serial crystallography workflows.
• JUNGFRAU proves versatile for various X-ray-based analytical techniques, including elemental analysis.