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Updated: Dec 26, 2025

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Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

Ann N Chiaramonti1, Luis Miaja-Avila2, Benjamin W Caplins1

  • 1Material Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO80305, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|March 13, 2020
PubMed

Keywords:
EUVatom probe tomographyfemtosecond pulsefield ion emission

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