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Related Experiment Video

Updated: Dec 26, 2025

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

Hexapole corrector for LVEM.

Jaromír Bačovský¹, Vladimír Kolařík¹

¹DELONG INSTRUMENTS a.s., Palackého třída 3019/153 b, 612 00 Brno, Czechia.

Ultramicroscopy

|March 18, 2020

Summary

This summary is machine-generated.

Aberration correction in low-voltage transmission electron microscopy is challenging. This study presents a hexapole corrector concept for improved spherical aberration correction, crucial for high-resolution imaging.

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Last Updated: Dec 26, 2025

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Area of Science:

Electron Microscopy
Optical Physics

Background:

Aberration correction is standard in high-voltage electron microscopes (50-200 kV).
Integrating correctors into low-voltage systems (5-25 kV) presents significant challenges.
Chromatic aberration remains a major obstacle to resolution in low-voltage electron microscopy.

Purpose of the Study:

To present a novel hexapole corrector concept for low-voltage transmission electron microscopy (LVTEM).
To address the challenges of spherical and chromatic aberration in LVTEM.
To enable high-resolution imaging in STEM mode at lower accelerating voltages.

Main Methods:

Design of a hexapole corrector utilizing permanent magnet technology.
Focus on a compact and low-complexity design.
Detailed analysis of the transfer lens doublet and its compensation systems for alignment.

Main Results:

The proposed hexapole corrector concept offers a promising solution for primary spherical aberration correction.
The design specifically targets STEM mode to minimize chromatic aberration from sample interaction.
Compensation systems ensure proper alignment of the transfer lens doublet.

Conclusions:

Hexapole correctors based on permanent magnets are viable for LVTEM aberration correction.
Careful consideration of chromatic aberration is essential for achieving high resolution.
The presented design facilitates improved performance in low-voltage electron microscopy applications.