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    Area of Science:

    • Optical Physics
    • Spectroscopy
    • Materials Science

    Background:

    • Fabry-Perot interferometry is a key technique for optical measurements.
    • Reflection phase shift dispersion is crucial for accurate interferometric analysis.
    • Characterizing broadband reflectors, especially multilayers, presents challenges.

    Purpose of the Study:

    • To develop a novel method for Fabry-Perot interferometry using fringes of equal chromatic order.
    • To enable wavelength calculation without prior knowledge of surface phase shifts.
    • To accurately measure phase shift dispersion for various optical reflectors.

    Main Methods:

    • Utilizing reflection phase shift dispersion data from fringes of equal chromatic order.
    • Employing Fabry-Perot patterns with large etalon spacing.
    • Determining interference orders using approximate theoretical phase shift versus wavelength.

    Main Results:

    • Accurate calculation of unknown wavelengths from Fabry-Perot patterns.
    • Measurement of phase shift dispersion to an accuracy of approximately 10 Å.
    • Successful application to aluminum films and 15-layer dielectric broadband reflectors in the visible spectrum.

    Conclusions:

    • The demonstrated method enhances Fabry-Perot interferometry by simplifying wavelength determination.
    • It is particularly effective for reflectors exhibiting significant phase shift dispersion, such as multilayers.
    • The technique offers a precise way to measure phase shift dispersion, advancing optical metrology.