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    This study introduces a novel surface profilometry technique using a single optical grating projection. It directly retrieves surface height distribution without phase transformation, proving feasible for complex surfaces.

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    Area of Science:

    • Optical engineering
    • Metrology
    • Surface characterization

    Background:

    • Traditional surface profilometry often requires complex setups and phase-to-height transformations.
    • Accurate measurement of complex surfaces remains a challenge in various scientific and industrial fields.

    Purpose of the Study:

    • To propose a novel surface profilometry method using a single optical grating projection.
    • To directly retrieve surface height distribution without phase-to-height transformation.
    • To demonstrate the feasibility of this method for complex surface measurement.

    Main Methods:

    • Utilizes a single optical grating projection setup with a small projection angle.
    • Retrieves height distribution by calculating the intersection of projecting rays and observing sight lines.
    • Employs fringe optical flow to detect observing point positions in fringe patterns.

    Main Results:

    • Establishes a relationship between optical flow and surface height distribution.
    • Simulations and primary experiments confirm the method's feasibility for complex surfaces.
    • Direct height distribution retrieval achieved, bypassing phase-to-height transformation.

    Conclusions:

    • The proposed surface profilometry method is novel and effective.
    • Direct height measurement offers a significant advantage over traditional techniques.
    • The technique shows promise for accurate characterization of complex surfaces.