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System design and error correction for 300 mm aperture vertical Fizeau spatial-temporal phase-shifting interferometer
Applied Optics
|April 1, 2020
Summary
A novel vertical Fizeau interferometer with a 300 mm aperture uses spatial and temporal phase-shifting techniques for precise measurement of large-aperture optical elements and dynamic surfaces.
Area of Science:
- Optics and Photonics
- Metrology
- Optical Engineering
Background:
- Growing demand for large-aperture planar optical elements in high-power laser applications (aerospace, electronics).
- Need for advanced measurement techniques to meet the precision requirements of these optical elements.
Purpose of the Study:
- To design and demonstrate a 300 mm aperture vertical Fizeau interferometer.
- To integrate spatial and temporal phase-shifting techniques for enhanced measurement capabilities.
- To validate the system's accuracy and ability to measure dynamic objects.
Main Methods:
- Design of a vertical Fizeau interference system with a laser source array for spatial phase-shifting.
- Integration of a tunable laser diode for temporal phase-shifting via wavelength tuning.
- Demonstration of key techniques: laser duplication, conjugate imaging, interferogram separation, and transmission flat assembly.
Main Results:
- Successful implementation of spatial phase-shifting using a laser source array.
- Realization of temporal phase-shifting through wavelength tuning.
- Elimination of systematic and position mismatch errors in interferograms.
- Demonstrated accuracy through comparison experiments and measurement of a dynamic water surface.
Conclusions:
- The developed 300 mm aperture vertical Fizeau interferometer effectively combines spatial and temporal phase-shifting.
- The system achieves high accuracy in measuring large-aperture optical elements.
- The interferometer is capable of measuring dynamic objects, showcasing its versatility.

