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Updated: Dec 25, 2025

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

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Carrier mobility of silicon by sub-bandgap time-resolved terahertz spectroscopy

Timothy J Magnanelli, Edwin J Heilweil

    Optics Express
    |April 1, 2020
    PubMed

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