Label-Free Imaging of Single Nanoparticles Using Total Internal Reflection-Based Leakage Radiation Microscopy

Liwen Jiang1,2, Xuqing Sun1, Hongyao Liu1

  • 1Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China.

Summary

This study introduces a label-free microscopy technique for fast, in situ detection of single nanoparticles. The method utilizes total internal reflection (TIR) leakage radiation to image nano-pollutants, crucial for environmental and health monitoring.