Probing the limits of full-field linear local defect resonance identification for deep defect detection

Joost Segers1, Saeid Hedayatrasa2, Gaétan Poelman2

  • 1Mechanics of Materials and Structures (UGent-MMS), Department of Materials, Textiles and Chemical Engineering (MaTCh), Ghent University, Technologiepark-Zwijnaarde 46, 9052 Zwijnaarde, Belgium.

Ultrasonics
|April 3, 2020
PubMed