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High-resolution electron microscopy image simulation on a Cray 1S/2300 computer
R Spycher1, P Stadelmann, P Buffat
1Institut Interdepartémental de Microscopie Electronique, EPFL, Swiss Institute of Technology, Lausanne.
Journal of Electron Microscopy Technique
|December 1, 1988
Abstract:
High-resolution electron microscopy (HREM) image simulation by the multislice method has been implemented on a Cray 1S/2300 computer, allowing accurate full nonlinear image intensity calculations with possible sampling up to 2n x 2m samples of the transmission function (n + m = 20). As examples of applications, images have been obtained from an interface in PbTiO3 and of a small gold aggregate. HREM image simulation of perfect or faulted crystals can now be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells.