Related Experiment Video
Updated: Dec 24, 2025

11:33
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
10.1K
Publisher's Note: "V-band nanosecond-scale pulse reflectometer diagnostic in the TCV tokamak" [Rev. Sci. Instrum. 90,
P Molina Cabrera1, S Coda1, L Porte1
1Ecole Polytechnique Federale de Lausanne (EPFL), Swiss Plasma Center (SPC), CH-1015 Lausanne, Switzerland.
The Review of Scientific Instruments
|April 9, 2020
Summary
No abstract available in PubMed .

