Simulations and Design of a Single-Photon CMOS Imaging Pixel Using Multiple Non-Destructive Signal Sampling

Area of Science:

• Electronics
• Photonics
• Semiconductor Devices

Background:

• Traditional CMOS image sensors (CIS) face limitations in detecting extremely low light levels.
• Achieving reliable single-photon detection is crucial for advanced scientific and industrial imaging.

Purpose of the Study:

• To design and simulate a novel CIS pixel architecture capable of single-photon detection.
• To investigate methods for reducing electronic readout noise in CIS pixels.

Main Methods:

• A pinned photodiode (PPD) based pixel design utilizing multiple, non-destructive charge transfers and sampling.
• TCAD simulations were performed to evaluate noise performance based on sampling parameters and device characteristics.
• Analysis of charge transfer inefficiency (CTI) and its impact on overall performance.

Main Results:

• Simulations demonstrate that averaging multiple independent signal measurements significantly reduces readout noise.
• The proposed design shows potential for distinguishing single photons reliably.
• Noise performance was analyzed as a function of sampling rate, capacitance, and transistor properties.

Conclusions:

• The developed pixel architecture shows promise for achieving single-photon imaging capabilities.
• This technology could lead to significant advancements in scientific and industrial imaging applications.
• Trade-offs between noise reduction and readout speed were identified, along with the impact of CTI.