Scanning Electron Microscopy
Overview of Microscopy Techniques
Overview of Electron Microscopy
Preparation of Samples for Electron Microscopy
Atomic Force Microscopy
Transmission Electron Microscopy
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Updated: Dec 24, 2025

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
Published on: March 12, 2017
Eisaku Oho1, Kazuhiko Suzuki2, Sadao Yamazaki1
1Department of Electrical and Electronic Engineering, Faculty of Engineering, Kogakuin University, 2665-1 Nakano-machi, Hachioji, Tokyo 192-0015, Japan.
This study introduces a fast TV-scan method for scanning electron microscopy (SEM), improving image acquisition speed without sacrificing quality. The new technique effectively reduces charging artifacts, a common challenge in SEM imaging.
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