Customized MFM probes based on magnetic nanorods

Area of Science:

• Materials Science
• Nanotechnology
• Physics

Background:

• Conventional sputtering-based Magnetic Force Microscopy (MFM) tips face limitations in resolution and customization.
• Existing MFM probes struggle with achieving high aspect ratios and precise control over geometry and composition.

Purpose of the Study:

• To present Focused Electron Beam Induced Deposition (FEBID) as an alternative for fabricating advanced magnetic MFM tips.
• To overcome the limitations of current MFM probes by developing high-aspect-ratio magnetic nanorod tips with customized properties.

Main Methods:

• Fabrication of magnetic nanorod tips using Focused Electron Beam Induced Deposition (FEBID).
• Characterization of nanorod geometry, composition, and magnetic properties.
• Performance evaluation of FEBID-fabricated tips in MFM measurements, including in liquid environments.

Main Results:

• Achieved high-aspect-ratio magnetic nanorods with sharp ends (~10 nm diameter), significantly improving lateral resolution.
• Demonstrated confined magnetic stray fields, enabling localized interactions and enhanced sensitivity without perturbing soft magnetic samples.
• FEBID tips exhibited higher coercivity (>900 Oe) compared to commercial probes.
• Successful MFM measurements in liquid environments were performed, showcasing probe versatility.

Conclusions:

• FEBID is a viable technique for fabricating customized, high-performance magnetic MFM tips.
• These novel tips offer superior resolution, sensitivity, and magnetic properties, expanding MFM capabilities.
• The ability to perform MFM in liquid environments opens new avenues for studying magnetic biological samples.