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    Area of Science:

    • Optical Engineering
    • Materials Science

    Background:

    • Characterizing thin-film filters requires precise optical measurement techniques.
    • Existing methods may lack the spectral and angular resolution needed for complex filter analysis.

    Purpose of the Study:

    • To present a novel light scattering measurement setup.
    • To enable spectral and angle-resolved characterization of light scattered by thin-film filters.

    Main Methods:

    • Utilized a high-power supercontinuum laser source.
    • Incorporated two volume hologram filters and two low-noise scientific grade cameras.
    • Developed a configuration for measurements from 400 to 1650 nm.

    Main Results:

    • Demonstrated spectral and angle-resolved characterization capabilities.
    • Successfully measured light scattering from complex thin-film filters.
    • Illustrated the setup's performance with specific filter measurements.

    Conclusions:

    • The new light scattering setup offers advanced capabilities for thin-film filter characterization.
    • The system provides high-resolution data across a broad spectral range.
    • The demonstrated performance validates the setup for optical filter analysis.