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Related Experiment Video

Updated: Dec 22, 2025

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Direct refractive index retrieval from interferometry measurements.

Mario Galletti¹, Swen Künzel¹, Joana Alves¹

¹GoLP/Instituto de Plasmas e Fusão Nuclear, Instituto Superior Técnico, 1049-001 Lisboa, Portugal.

The Review of Scientific Instruments

|May 3, 2020

Summary

This summary is machine-generated.

A novel numerical method offers an alternative to Abel inversion for analyzing complex, non-symmetrical systems. This technique accurately retrieves plasma properties and temperatures from hot air plumes.

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Area of Science:

Physics
Optical diagnostics
Plasma physics

Background:

Abel inversion is a standard technique for analyzing cylindrically symmetrical data.
Complex and non-symmetrical systems pose challenges for traditional Abel inversion.
Accurate retrieval of physical parameters like temperature and refractive index is crucial for various applications.

Purpose of the Study:

To introduce and validate an alternative numerical method for data inversion.
To demonstrate the method's applicability to complex, non-symmetrical systems.
To compare the performance of the new method against Abel inversion.

Main Methods:

Development of a novel numerical inversion technique.
Application of the method to synthetic data of a plasma waveguide with a parabolic density profile.
Experimental validation using a plume of hot air around a non-cylindrical soldering iron.

Main Results:

The proposed method successfully analyzed non-symmetrical systems.
Benchmarking against Abel inversion showed comparable accuracy and resolution.
Accurate retrieval of temperature (50 °C–200 °C) and refractive index was achieved for the hot air plume.

Conclusions:

The new numerical method provides a robust and fast alternative to Abel inversion.
It is suitable for complex, non-symmetrical systems where Abel inversion is limited.
The method maintains high accuracy and resolution for practical applications.