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Long Exposure Short Pulse Synchronous Phase Lock Method for Capturing High Dynamic Surface Shape.

Weiqiang Han^1,2,3, Xiaodong Gao^1,2,3, Zhenjie Fan^1,2

¹Institute of Optics and Electronics of Chinese Academy of Sciences, Chengdu 610209, China.

Sensors (Basel, Switzerland)

|May 6, 2020

Summary

Measuring the dynamic surface shape of high-frequency vibrating mirrors (VMs) is crucial for infrared imaging systems. A new long exposure short pulse synchronous phase lock (LSPL) method enables this measurement using a single laser pulse and a standard 10 FPS camera.

Keywords:

interference pattern laser repeat frequency pulsed laser short pulse synchronous phase lock vibrating mirrors

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Area of Science:

Optical Engineering
Metrology
Infrared Imaging Systems

Background:

High-frequency vibrating mirrors (VMs) are essential components in infrared weak target detection systems.
The dynamic surface shape of VMs significantly influences imaging quality and optical modulation.
Accurate measurement of VM dynamic surface shape is challenging due to high vibration frequencies.

Purpose of the Study:

To develop a novel method for measuring the dynamic surface shape of high-frequency vibrating mirrors.
To overcome the technical limitations of traditional high-speed imaging for VM analysis.
To enable dynamic surface shape measurement with standard camera frame rates.

Main Methods:

Introduction of the long exposure short pulse synchronous phase lock (LSPL) method.
Utilizing a single laser pulse for illumination.
Employing a camera operating at a standard frame rate (10 FPS) for image acquisition.

Main Results:

The LSPL method successfully captures the dynamic surface shape of VMs.
Measurement is achievable with a camera operating at 10 FPS, far below the required 1.34 MFPS for traditional methods.
Dynamic surface shape measurement is accomplished using a single frame image.

Conclusions:

The proposed LSPL method provides a feasible solution for measuring the dynamic surface shape of high-frequency vibrating mirrors.
This technique overcomes the limitations of current high-speed imaging technologies for VM analysis.
The method simplifies the measurement process, enabling dynamic surface shape assessment with standard equipment.