Confocal Fluorescence Microscopy
Overview of Microscopy Techniques
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Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Ryung Shin1,2, Woojae Choi1, Taekyung Kim3
1School of Mechanical Engineering, Yonsei University, Seoul, 03722, South Korea.
This study introduces high-throughput gigapixel confocal imaging using a novel optical probe array and single directional infinite scanning for enhanced microscopy. The system achieves high lateral resolution and a wide field-of-view, advancing imaging capabilities.
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