Two-color symmetry breaking in laser-based secondary neutral mass spectrometry

An alternative method of analysis for laser-based secondary neutral mass spectrometry is introduced.

By mixing a fundamental 1240 nm wavelength of the near-infrared laser field with an intensity of 1 × 10¹⁵  W/cm² with its second harmonic generation wavelength of 620 nm, control is attained over the ion yield in secondary neutral mass spectrometry for a native silver surface and a surface covered with silver nanoparticles.

The ion yields of selected species in the mass spectra, such as a C₂ H₄ O₂ surfactant fragment ion and the Ag ion, are enhanced or suppressed by a factor of 8 or 23, respectively, in comparison with single color post-ionization. In addition, a significant suppression of ion fragmentation is demonstrated for both the silver sample and silver nanoparticles. Periodic variation of the ion yield with a modulation depth of 4% is observed depending upon the relative phase between the fundamental and second harmonic generated fields. These variations are explained in terms of tunneling ionization with symmetry-broken fields.

An additional degree of freedom in a form of additional second color is introduced in laser-based secondary neutral mass spectrometry. Ion yield control is extended in a form of symmetry-broken fields.