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Linearized segmentation method for measuring the phase transfer function of a silicon Mach-Zehnder modulator by using
Applied Optics
|May 14, 2020
Summary
A new linearity segmentation method accurately measures silicon Mach-Zehnder modulators (SMZMs) phase shift curves. This technique enables precise calculation of key SMZM parameters like radio frequency half-wave voltage and 3 dB bandwidth.
Area of Science:
- Optoelectronics
- Photonics
- Semiconductor Devices
Background:
- Silicon Mach-Zehnder modulators (SMZMs) are crucial for optical communication systems.
- Accurate characterization of SMZM linearity and phase shift is essential for device optimization.
- Existing methods may face limitations in precision or scope for dynamic parameter extraction.
Purpose of the Study:
- To present a novel linearity segmentation method for measuring SMZM phase shift curves.
- To enable the calculation of phase shift as a function of applied electric field, modulation frequency, and reverse PN voltage.
- To facilitate the extraction of key SMZM parameters from the measured phase shift curves.
Main Methods:
- A small sinusoidal signal is applied to the traveling-wave electrode for differential phase modulation.
- A wavelength-adjustable local oscillator source is used for heterodyning the optical signal.
- A balanced detector with a low-speed transimpedance amplifier performs photoelectric conversion, suppressing DC components and noise.
- Beat-frequency and harmonic sideband signals are extracted at specific phase biases (0 and π) to calculate phase shift slopes.
Main Results:
- The method successfully transforms the modulated optical signal into the low-frequency electric field domain.
- Phase shift slopes for upper and lower arms are calculated under varying reverse PN voltages.
- The phase shift is accurately determined as a function of modulation frequency and reverse PN voltage.
- Simulation and measurement results validate the proposed linearity segmentation method.
Conclusions:
- The proposed method provides a robust approach for characterizing SMZM linearity and phase shift.
- Key device parameters, including radio frequency half-wave voltage, chirp characteristics, and 3 dB bandwidth, can be reliably extracted.
- This technique enhances the ability to analyze and optimize silicon Mach-Zehnder modulators for high-performance applications.
