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Short-Term Test-Retest Reliability of Electrically Evoked Cortical Auditory Potentials in Adult Cochlear Implant
Meghan Pike1, Leigh Biagio-de Jager1, Talita le Roux1
1Department of Speech Language Pathology and Audiology, University of Pretoria, Pretoria, South Africa.
Frontiers in Neurology
|May 16, 2020
Summary
Electrically evoked cortical auditory evoked potentials (eCAEPs) show moderate to good short-term reliability in cochlear implant (CI) users. While overall results were consistent, individual variability in eCAEPs suggests attention and listening effort play a role.
Area of Science:
- Auditory Neuroscience
- Biomedical Engineering
- Audiology
Background:
- Late latency auditory evoked potentials (LLAEPs) objectively assess central auditory processing.
- Electrically evoked cortical auditory evoked potentials (eCAEPs) measure aided speech perception in cochlear implant (CI) recipients.
Purpose of the Study:
- To evaluate the short-term test-retest reliability of eCAEPs in adult CI recipients.
Main Methods:
- A within-subject repeated measures design was used.
- eCAEPs were recorded from basal, medial, and apical cochlear regions in 12 post-lingually deafened adults with unilateral CIs.
- Measurements were repeated after 7 days.
Main Results:
- No significant differences in median latencies or amplitudes were found between test and retest sessions (p > 0.05).
- Intraclass correlation coefficient (ICC) scores for consistency and agreement ranged from moderate to good (0.58-0.86, p < 0.05).
- Confidence intervals revealed considerable individual variability in latency and amplitude measurements.
Conclusions:
- eCAEP latencies and amplitudes exhibit moderate to good short-term test-retest reliability.
- Individual variability in eCAEP consistency may be influenced by participant attention and listening effort.
