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Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses

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Nonlinear interference in crystal superlattices.

Anna V Paterova¹, Leonid A Krivitsky¹

¹Institute of Materials Research and Engineering (IMRE), Agency for Science Technology and Research (ASTAR), 138634 Singapore, Singapore.

Light, Science & Applications

|May 16, 2020

Summary

This summary is machine-generated.

Researchers developed advanced nonlinear interferometers using multiple crystal superlattices for enhanced optical sensing. This breakthrough improves sensitivity and enables new applications in metrology and spectroscopy.

Keywords:

Nonlinear optics Quantum optics

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Area of Science:

Quantum optics
Optical metrology

Background:

Nonlinear interferometers with correlated photons offer enhanced phase sensitivity for optical characterization.
Current limitations exist in realizing interferometers with more than two nonlinear elements, hindering performance gains.

Purpose of the Study:

To construct and investigate a nonlinear interferometer incorporating multiple nonlinear elements (crystal superlattices).
To demonstrate enhanced sensitivity for metrology applications, specifically gas sensing.

Main Methods:

Fabrication of a stable and versatile nonlinear interferometer with up to five crystal superlattices.
Analysis of interference pattern modifications with varying superlattice configurations.
Proof-of-concept gas sensing experiment utilizing the enhanced interferometer.

Main Results:

Successful construction of a nonlinear interferometer with up to five superlattices.
Demonstration of modified interference patterns based on superlattice configuration.
Achieved enhanced sensitivity in a proof-of-concept gas sensing application.

Conclusions:

The developed multi-superlattice nonlinear interferometer overcomes previous experimental limitations.
This approach provides a pathway for broader adoption of nonlinear interferometry in imaging, interferometry, and spectroscopy.
The technology promises improved performance and affordability in optical characterization and metrology.