Low-frequency noise induced by cation exchange fluctuation on the wall of silicon nitride nanopore

Kazuma Matsui1,2, Yusuke Goto3,4, Itaru Yanagi3

  • 1Center for Technology Innovation - Healthcare, Research and Development Group, Hitachi, Ltd., 1-280 Higashi-Koigakubo, Kokubunji, Tokyo, 185-8601, Japan. kazuma.matsui.yo@hitachi.com.

Scientific Reports
|May 28, 2020
PubMed

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