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A Comparison of Different Counting Methods for a Holographic Particle Counter: Designs, Validations and Results
Georg Brunnhofer1,2,3, Isabella Hinterleitner2, Alexander Bergmann3
1Nanophysics & Sensor Technologies, AVL List GmbH, 8020 Graz, Austria.
Sensors (Basel, Switzerland)
|May 30, 2020
Summary
Digital holographic imaging (DIH) can determine particle concentrations by counting circular fringe patterns. This study simplifies DIH for particle density analysis by focusing on fringe pattern detection rather than full 3D reconstruction.
Area of Science:
- 3D Imaging
- Optical Metrology
- Particle Analysis
Background:
- Digital holographic imaging (DIH) is widely used for 3D particle analysis, often requiring complex wavefront reconstruction.
- Observing particle densities, particularly for spherical particles like those in High Performance Computing (HPC) applications, presents a simplified imaging challenge.
- Spherical particles generate circular fringe patterns on the hologram plane, detectable via 2D image processing.
Purpose of the Study:
- To investigate a simplified approach for determining particle number concentrations using fringe pattern analysis in DIH.
- To identify and extract key features from fringe patterns for effective recognition.
- To develop and compare pattern recognition techniques for detecting and counting fringe patterns.
Main Methods:
- Analysis of fringe pattern characteristics at the hologram plane.
- Feature extraction from fringe patterns to guide pattern recognition.
- Development and customization of three distinct fringe pattern detection and counting algorithms.
Main Results:
- Identification of relevant fringe pattern features for pattern recognition.
- Successful implementation of three customized techniques for fringe pattern detection.
- Comparative analysis of the developed techniques based on detection performance and computational efficiency.
Conclusions:
- Particle number concentration can be accurately determined by counting fringe patterns, simplifying DIH applications.
- The extracted fringe pattern features are crucial for selecting and parameterizing appropriate recognition algorithms.
- The presented techniques offer viable solutions for efficient and accurate fringe pattern detection in particle density analysis.

