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Updated: Dec 20, 2025

Conducting Multiple Imaging Modes with One Fluorescence Microscope
Published on: October 28, 2018
Integrated super resolution fluorescence microscopy and transmission electron microscopy.
Sajjad Mohammadian1, Alexandra V Agronskaia1, Gerhard A Blab1
1Molecular Biophysics, Department of Physics, Faculty of Science, Utrecht University, Princetonplein 1, 3584 CC Utrecht, Netherlands.
This study presents an integrated super-resolution fluorescence microscopy (FM) and transmission electron microscopy (TEM) system. This novel approach enhances correlative light and electron microscopy (CLEM) by reducing resolution gaps and improving sample handling.
Area of Science:
- Microscopy
- Cell Biology
- Biophysics
Background:
- Correlative light and electron microscopy (CLEM) combines fluorescence microscopy (FM) and electron microscopy (EM) for multi-modal imaging.
- A key limitation in CLEM is the significant resolution difference between FM and EM.
- Current CLEM workflows often involve separate setups, risking sample damage and complicating region identification.
Purpose of the Study:
- To develop and present an integrated super-resolution FM and TEM system for enhanced CLEM.
- To reduce the resolution gap between FM and EM in CLEM.
- To improve correlation accuracy and streamline the CLEM workflow by avoiding sample transfer.
Main Methods:
- Integration of a wide-field super-resolution FM within a Transmission Electron Microscope (TEM).
- Utilized a rotating TEM sample holder for seamless switching between imaging modalities.
- Employed fiducial markers for accurate image overlay between FM and TEM datasets.
- Experimentally validated on Lowicryl embedded Human Umbilical Vein Endothelial Cells labeled for Caveolin.
Main Results:
- Demonstrated successful overlay of TEM and FM images with an accuracy of 28 ± 11 nm.
- Achieved overlay accuracy close to the optical resolution limit of ~50 nm.
- Presented initial imaging experiments on labeled endothelial cells, showcasing the system's capability.
Conclusions:
- The integrated super-resolution CLEM system effectively bridges the resolution gap between FM and EM.
- The presented approach minimizes sample manipulation, reducing potential damage and improving workflow efficiency.
- This integrated system offers a promising advancement for high-resolution cellular ultrastructure analysis in correlative microscopy.
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