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Quantitative imaging of structured complex metal oxide thin films using online-LASIL-ICP-MS
C Herzig1, J Frank2, A K Opitz1
1TU Wien, Institute of Chemical Technologies and Analytics, Vienna, Austria.
Talanta
|June 6, 2020
Summary
Online-laser ablation of solids in liquid (online-LASIL) coupled with ICP-MS provides 2D imaging for complex metal oxide thin films. This new method enables simultaneous online quantification, improving analysis accuracy.
Area of Science:
- Analytical Chemistry
- Materials Science
- Surface Science
Background:
- Complex metal oxide (CMO) thin films require advanced analytical techniques for precise characterization.
- Existing methods for analyzing thin film composition often lack spatial resolution or are time-consuming.
- Developing novel sampling strategies is crucial for detailed analysis of nanostructured materials.
Purpose of the Study:
- To introduce and validate online-laser ablation of solids in liquid (online-LASIL) coupled with ICP-MS as a 2D imaging technique for CMO thin films.
- To demonstrate the capability of correlating signal intensities with spatial origin on the sample surface.
- To develop a method for simultaneous online quantification of thin film composition.
Main Methods:
- Utilized an in-house built and optimized online-LASIL ablation cell for minimal particle dispersion.
- Prepared geometrically structured CMO thin films with varying compositions using pulsed laser deposition (PLD) and ion beam etching.
- Employed inductively coupled plasma mass spectrometry (ICP-MS) for elemental analysis.
- Implemented a standard addition concept for simultaneous online quantification.
Main Results:
- Achieved the first reported 2D intensity maps of 220 nm thick CMO thin films using online-LASIL.
- Successfully correlated signal intensities with the spatial origin of the signal on the sample.
- Developed and validated a new approach for simultaneous online quantification, correcting for instrumental drift.
Conclusions:
- Online-LASIL coupled with ICP-MS is a powerful technique for 2D elemental imaging of thin films.
- The developed method allows for precise spatial analysis and accurate online quantification of complex materials.
- This approach offers significant advancements in the characterization of nanostructured thin films.

