Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

2.7K
Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
2.7K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

5.1K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
5.1K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

12.7K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
12.7K
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

6.6K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
6.6K
Cryo-electron Microscopy01:28

Cryo-electron Microscopy

4.0K
Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...
4.0K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Air-Stable Lithiation of MoS<sub>2</sub> for Direct-Bandgap Multilayers.

Small science·2025
Same author

Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases.

Ultramicroscopy·2025
Same author

Textureless Deformable Object Tracking With Invisible Markers.

IEEE transactions on pattern analysis and machine intelligence·2024
Same author

Metalens enhanced ray optics: an end-to-end wave-ray co-optimization framework.

Optics express·2023
Same author

Giant piezoresistivity in a van der Waals material induced by intralayer atomic motions.

Nature communications·2023
Same author

Anomalous intense coherent secondary photoemission from a perovskite oxide.

Nature·2023

Related Experiment Video

Updated: Dec 19, 2025

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser
09:00

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

Published on: June 28, 2018

10.3K

Aberration corrected spin polarized low energy electron microscope.

Lei Yu1, Weishi Wan2, Takanori Koshikawa3

  • 1College of Materials Science and Engineering, Chongqing University, Chongqing 400044, China.

Ultramicroscopy
|June 8, 2020
PubMed
Summary

Spin Polarized Low Energy Electron Microscopy (SPLEEM) now offers aberration correction for unprecedented detail in magnetic structure analysis. This advancement provides high-resolution insights into ultra-thin ferromagnetic films.

More Related Videos

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

10.5K
Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
08:53

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures

Published on: October 9, 2012

18.0K

Related Experiment Videos

Last Updated: Dec 19, 2025

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser
09:00

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

Published on: June 28, 2018

10.3K
Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

10.5K
Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
08:53

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures

Published on: October 9, 2012

18.0K

Area of Science:

  • Surface Science
  • Materials Science
  • Condensed Matter Physics

Background:

  • Spin Polarized Low Energy Electron Microscopy (SPLEEM) is crucial for analyzing magnetic structures at the atomic level.
  • Existing SPLEEM techniques have limitations in achieving atomic depth scale resolution.
  • Ultra-thin ferromagnetic films require high-resolution methods for detailed magnetic studies.

Purpose of the Study:

  • To report the first implementation of aberration corrected Spin Polarized Low Energy Electron Microscopy (AC-SPLEEM).
  • To demonstrate the enhanced capabilities of AC-SPLEEM for studying magnetic structures.
  • To evaluate the performance of the AC-SPLEEM setup on relevant material systems.

Main Methods:

  • Utilizing an aberration corrected Low Energy Electron Microscopy (LEEM) instrument.
  • Employing a high brightness spin-polarized electron gun.
  • Testing the AC-SPLEEM setup on nanoscale ferromagnetic Fe islands grown on a W(110) single crystal substrate.

Main Results:

  • Successful realization and implementation of aberration corrected SPLEEM (AC-SPLEEM).
  • Achieved a spatial resolution of 3.3 nm in spin asymmetry images.
  • Demonstrated the capability to reveal magnetic structure details on ferromagnetic surfaces.

Conclusions:

  • Aberration corrected SPLEEM (AC-SPLEEM) significantly enhances the study of magnetic structures.
  • The developed AC-SPLEEM provides high spatial resolution for ultra-thin ferromagnetic film analysis.
  • This advancement opens new avenues for detailed investigations in surface magnetism.