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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Time-resolved open-circuit conductive atomic force microscopy for direct electromechanical characterisation.

Yonatan Calahorra¹, Wonjong Kim, Jelena Vukajlovic-Plestina

¹Department of Materials Science and Metallurgy, University of Cambridge, CB3 0FS, Cambrdige, United Kingdom.

|June 11, 2020

Summary

New time-resolved conductive atomic force microscopy (cAFM) enables direct measurement of piezoelectricity in nanomaterials. This method distinguishes piezoelectric and triboelectric effects, advancing nanoscale energy harvesting and sensing applications.

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Area of Science:

Materials Science
Nanotechnology
Physics

Background:

Piezoelectricity and triboelectricity in nanomaterials are key for energy and sensing, but quantitative characterization is challenging.
Current methods like piezoresponse force microscopy (PFM) primarily measure the converse piezoelectric effect, not the direct effect crucial for energy harvesting.
Conflicting reports arise from the difficulty in isolating and measuring electromechanical effects at the nanoscale.

Purpose of the Study:

To develop and validate a new methodology for direct electromechanical characterization of nanomaterials.
To address the limitations of existing techniques in quantitatively measuring the direct piezoelectric effect.
To differentiate between piezoelectric and triboelectric signals in nanomaterials.

Main Methods:

Development of time-resolved open-circuit conductive atomic force microscopy (cAFM) for direct piezoelectric measurements.
Theoretical and experimental validation of the cAFM methodology.
Application of the method to GaAs nanowires to measure their vertical piezoelectric coefficient.

Main Results:

Standard short-circuit cAFM is inadequate for piezoelectric characterization due to competing mechanisms.
Time-resolved open-circuit cAFM successfully distinguishes between triboelectric and piezoelectric signals.
Quantitative characterization of the vertical piezoelectric coefficient for GaAs nanowires yielded results (∼ 1-3 pm V⁻¹) consistent with theory.

Conclusions:

Time-resolved open-circuit cAFM is a significant advancement for quantitative nanoscale piezoelectric characterization.
The new methodology enhances understanding of coexisting electromechanical effects in nanomaterials.
Easy implementation of this technique will facilitate broader research in nanoscale electromechanics.