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Updated: Dec 18, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

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Intrinsic ferromagnetic semiconductivity realized in a new MoS2 monolayer

Xiaohui Deng1, Zhenyu Li

  • 1Hefei National Laboratory for Physical Sciences at the Microscale and Synergetic Innovation Center of Quantum Information & Quantum Physics, University of Science and Technology of China, Hefei, Anhui 230026, China. x.deng@hynu.edu.cn.

Physical Chemistry Chemical Physics : PCCP
|June 13, 2020
PubMed

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