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Phase Contrast and Differential Interference Contrast DIC Microscopy
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Near Field Differential Interference Contrast Microscopy.

Hesam Heydarian1, Payam Yazdanfar1, Arezoo Zarif1

  • 1Department of Electrical Engineering, Sharif University of Technology, Tehran, 11365-8639, Iran.

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|June 17, 2020
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This study demonstrates a new near-field scanning optical microscopy technique using a dual color probe for enhanced differential interference contrast. The method improves signal-to-noise ratio and sensitivity for high-resolution imaging of sample topography and material properties.

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Nanotechnology

Background:

  • Near-field scanning optical microscopy (NSOM) offers high spatial resolution.
  • Differential interference contrast (DIC) enhances visualization of optical path differences.
  • Existing NSOM techniques face challenges in simultaneous multi-point illumination and phase information retrieval.

Purpose of the Study:

  • To demonstrate a novel near-field differential interference contrast (NFDIC) technique.
  • To achieve simultaneous illumination of two neighboring sample points.
  • To retrieve phase difference information with enhanced sensitivity and signal-to-noise ratio (SNR).

Main Methods:

  • Implementation of a dual-color probe based on plasmonic color sorter for near-field beam splitting.
  • Simultaneous illumination of two adjacent points on the sample.
  • Modulation of two wavelengths and measurement of near-field photoinduced force at the difference of modulation frequencies.
  • Engineering the frequency difference to match the cantilever's resonant frequency.

Main Results:

  • Successful demonstration of NFDIC microscopy.
  • Simultaneous illumination of neighboring points achieved.
  • Phase difference information retrieved by measuring photoinduced force.
  • Improved SNR and sensitivity due to resonant frequency matching.
  • Investigation of topographical and material changes in CNT and silica samples.

Conclusions:

  • The proposed NFDIC technique enables high contrast and high spatial resolution microscopy.
  • This method is promising for detailed characterization of nanoscale samples.
  • The dual-color probe and frequency modulation approach offer significant advantages over conventional techniques.