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This study combines X-ray photoemission electron microscopy (XPEEM) with coherent X-ray scattering to overcome XPEEM

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Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • X-ray photoemission electron microscopy (XPEEM) is a powerful synchrotron-based imaging technique.
  • XPEEM faces limitations with external fields and short electron mean free paths.
  • Coherent X-ray scattering (CXS) offers complementary capabilities, particularly for buried interfaces and external field compatibility.

Purpose of the Study:

  • To enhance XPEEM capabilities by integrating coherent X-ray scattering.
  • To overcome limitations of XPEEM, such as external field application and electron mean free path.
  • To demonstrate a combined technique for advanced materials characterization.

Main Methods:

  • Adaptation of an existing XPEEM instrument.
  • Simultaneous measurement of XPEEM and coherent X-ray scattering in reflectivity mode.
  • Application of the combined technique to an artificial spin-ice lattice.

Main Results:

  • Successful integration of XPEEM and coherent X-ray scattering.
  • Demonstration of sensitivity to buried interfaces using photon-in photon-out scattering.
  • Overcoming challenges of external field application in imaging.
  • XPEEM aiding reconstruction methods in coherent diffraction imaging.
  • Characterization of an artificial spin-ice lattice with both chemical and magnetic contrast.

Conclusions:

  • The combined XPEEM and coherent X-ray scattering technique offers synergistic advantages.
  • This hybrid approach expands the applicability of XPEEM, especially for studies under external fields.
  • The method provides a powerful tool for nanoscale chemical and magnetic imaging of complex materials.