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Integrated Data-Driven Process Monitoring and Explicit Fault-Tolerant Multiparametric Control
Melis Onel1,2, Baris Burnak1,2, Efstratios N Pistikopoulos1,2
1† Artie McFerrin Department of Chemical Engineering, Texas A&M University, College Station, Texas 77843, United States.
Abstract:
We propose a novel active fault-tolerant control strategy that combines machine learning based process monitoring and explicit/multiparametric model predictive control (mp-MPC). The strategy features (i) data-driven fault detection and diagnosis models by using the support vector machine (SVM) algorithm, (ii) ranking via a nonlinear, kernel-dependent, SVM-based feature selection algorithm, (iii) data-driven regression models for fault magnitude estimation via the random forest algorithm, and (iv) a parametric optimization and control (PAROC) framework for the design of the explicit/multiparametric model predictive controller. The resulting explicit control strategies correspond to affine functions of the system states and the magnitude of the detected fault. A semibatch process, an example for penicillin production, is presented to demonstrate how the proposed framework ensures smart operation for which rapid switches between a priori computed explicit control action strategies are enabled by continuous process monitoring information.
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