Related Experiment Video
Updated: Dec 18, 2025
Measuring the Complete-arch Distortion of an Optical Dental Impression
Published on: May 30, 2019
Solid index impression protocol: a hybrid workflow for high accuracy and passive fit of full-arch implant-supported
Aim:
The purpose of this article is to present the preliminary clinical results obtained with a novel hybrid digital-analog technique, the solid index impression protocol (SIIP), which uses a solid index to capture accurate impressions of multiple implants for the fabrication of implant-supported fixed full arches (FFAs).
Materials And Methods:
This pilot study was based on five patients, each treated with a FFA supported by four implants. Three months after implant placement, impressions were taken for all patients with an intraoral scanner (IOS) (direct digital impression) and with the SIIP, using a custom tray consisting of four hollow cylinders connected with a bar. This index was linked to the implant transfers and transferred to the laboratory, and the definitive FFAs were fabricated based on it. The outcomes of the study were the passive fit of implant superstructures and the accuracy of the models generated by the SIIP, inspected using a coordinate measuring machine (CMM) and reverse engineering software, and compared with the accuracy of direct digital impressions.
Results:
Excellent clinical precision and passive fit were obtained in all five implant-supported FFAs fabricated with the SIIP. One year after delivery, all FFAs were functional without any complication. Differences in accuracy were found between the SIIP and direct intraoral scanning.
Conclusions:
The SIIP seems to represent a viable option for capturing accurate impressions for the fabrication of clinically precise implant-supported FFAs with a hybrid digital-analog workflow. Further studies are needed to confirm these results.
