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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which...
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Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

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Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
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Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization.

Seth Kenkel1,2, Shachi Mittal1, Rohit Bhargava3,4,5

  • 1Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana Champaign, Urbana, IL, 61801, USA.

Nature Communications
|June 28, 2020
PubMed
Summary

This study introduces a closed-loop controller for Atomic Force Microscopy-Infrared (AFM-IR) imaging, improving nanoscale molecular analysis. The new method reduces noise and artifacts, enabling reliable characterization on common substrates like glass and silicon.

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Area of Science:

  • Spectroscopy
  • Nanotechnology
  • Materials Science

Background:

  • Atomic Force Microscopy-Infrared (AFM-IR) offers nanoscale molecular contrast.
  • Strict sample preparation is required to mitigate artifacts and enhance sensitivity.
  • Common substrates like silicon and glass present challenges for reliable AFM-IR characterization.

Purpose of the Study:

  • To develop a closed-loop (CL) piezo controller for responsivity-corrected AFM-IR imaging.
  • To overcome limitations of traditional AFM-IR by reducing noise and artifacts.
  • To enable facile and reliable nanoscale molecular characterization on diverse substrates.

Main Methods:

  • Demonstrated a closed-loop piezo controller design for AFM-IR.
  • Implemented a zero amplitude harmonic cantilever deflection feedback mechanism.
  • Utilized subsample piezo control to maintain null cantilever deflection.

Main Results:

  • Piezo voltage directly measures local IR absorption with reduced noise.
  • Successfully characterized nanothin PMMA films on glass and silicon.
  • Validated the robust capability of CL AFM-IR for routine nanoscale molecular mapping.

Conclusions:

  • The closed-loop controller significantly enhances the reliability and sensitivity of AFM-IR imaging.
  • This approach simplifies sample preparation and expands substrate compatibility.
  • CL AFM-IR provides a robust tool for routine nanoscale molecular analysis.