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Publisher's Note: "CRISP: A compact RF ion source prototype for emittance scanner testing" [Rev. Sci. Instrum. 91,

C Poggi¹, E Sartori¹, M Zuin¹

¹Consorzio RFX (CNR, ENEA, INFN, Università di Padova, Acciaierie Venete S.p.A.), C. Stati Uniti 4, 35127 Padova, Italy.

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Summary

No abstract available in PubMed .

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