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Updated: Dec 16, 2025

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Ion temperature measurement techniques using fast sweeping retarding field analyzer (RFA) in strongly intermittent
R Ochoukov1, M Dreval2, V Bobkov1
1Max Planck Institute for Plasma Physics, Boltzmannstr. 2, 85748 Garching, Germany.
Abstract:
This manuscript presents a new method of interpreting the ion temperature (Ti) measurement with a retarding field analyzer (RFA) that accounts for the intermittent/turbulent nature of the scrape off layer (SOL) plasmas in tokamaks. Fast measurements and statistical methods are desirable for an adequate description of random fluctuations caused by such intermittent events as edge localized modes (ELMs) and blobs. We use a RFA that can sweep its current-voltage (I-V) characteristics with up to 10 kHz. The RFA uses an electronics compensation stage to subtract the capacitive pickup due to the finite connecting cable capacitance, which greatly improves the signal-to-noise ratio. In the 10 kHz case, a single I-V characteristic is obtained in time, which is an order of magnitude faster than the ELM cycle. The fast sweeping frequency allows us to reconstruct the Ti probability density function (PDF), which we use as the Ti representation. The boundary conditions that we place on the I-V characteristics when calculating the Ti values impact the resulting Ti PDF. If the boundaries are insensitive to the plasma fluctuations, then the most probable Ti value of the PDF (20 eV-25 eV) is similar to the Ti value obtained via the classical conditional averaging method (20 eV-27 eV). However, if the boundary conditions follow the fluctuations, then the PDF-based method gives a substantially higher most probable Ti value (35 eV-60 eV). Overall, we show that a fast sweeping RFA diagnostic should be used in intermittent SOL plasmas to reconstruct the PDF for accurate Ti measurements.
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