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Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope
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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and

Magnus Nord1,2, Robert W H Webster1, Kirsty A Paton1

  • 1SUPA, School of Physics and Astronomy, University of Glasgow, GlasgowG12 8QQ, UK.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|July 7, 2020
PubMed

Keywords:
4D STEMMedipix3fast pixelated detectorfile formatslive data processing

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