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Updated: Jun 16, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
Measurement of In-Plane Motions in MEMS
Mohamed Arabi1, Mary Gopanchuk2, Eihab Abdel-Rahman1
1Department of Systems Design Engineering, University of Waterloo, Waterloo N2L 3G1, ON, Canada.
Abstract:
We report a technique to measure in-plane and out-of-plane motions of MEMS using typical out-of-plane (single-axis) Laser Doppler Vibrometers (LDVs). The efficacy of the technique is demonstrated by evaluating the in-plane and out-of-plane modal response and frequency response of an interdigitated comb-drive actuator. We also investigate the validity of observing planar modes of vibration outside their dominant plane of motion and find that it leads to erroneous results. Planar modes must be evaluated in their plan of motion.
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