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Updated: Dec 15, 2025

Scanning SQUID Study of Vortex Manipulation by Local Contact

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Diffractometry-based vortex beams fractional topological charge measurement.

S M A Hosseini-Saber, Ehsan A Akhlaghi, Ahad Saber

|July 8, 2020

Summary

This summary is machine-generated.

Researchers developed a new method to determine the fractional topological charge of vortex beams using Fresnel diffraction. This technique offers high precision and is independent of experimental parameters.

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Area of Science:

Optics and Photonics
Quantum Information Science

Background:

Vortex beams, characterized by their helical phase front and orbital angular momentum, are crucial in various optical applications.
Determining the fractional topological charge of vortex beams is essential for advanced optical manipulation and quantum information processing.

Purpose of the Study:

To propose and experimentally validate a novel method for precisely measuring the fractional topological charge of vortex beams.
To demonstrate the robustness and parameter independence of the proposed diffraction-based technique.

Main Methods:

Investigating the Fresnel diffraction of vortex beams interacting with the edge of a phase plate.
Analyzing the periodic changes in diffraction pattern visibility on opposing sides of the beam as the phase plate rotates.
Utilizing measurements of three consecutive minimum visibility angles to calculate the fractional topological charge.

Main Results:

A distinct difference in diffraction pattern visibility on either side of the beam was observed for fractional topological charges.
The proposed method accurately determines the fractional topological charge, achieving a precision better than 0.01.
Experimental validation confirmed the method's independence from specific phase plate properties and vortex beam parameters.

Conclusions:

The developed method provides a reliable and precise approach for quantifying the fractional topological charge of vortex beams.
This technique has potential applications in optical metrology, quantum communication, and advanced optical system characterization.