Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

LIDT measurement routine to assist coating optimization studies of low defect density optics in the nanosecond pulse regime.

Applied optics·2026
Same author

Spectral Tuning of Hyperbolic Shear Polaritons in Monoclinic Gallium Oxide via Isotopic Substitution.

Advanced materials (Deerfield Beach, Fla.)·2026
Same author

Terahertz frequency-domain 4 × 4 Mueller matrix ellipsometer instrument designed for high-frequency magnetic resonance measurements.

The Review of scientific instruments·2025
Same author

Relocate to compete: a critical view on the diaspora of Russian athletes.

Frontiers in sports and active living·2025
Same author

The autonomy of sport concept: a scoping review.

Frontiers in sports and active living·2025
Same author

Magnetic Lyddane-Sachs-Teller Relation.

Physical review letters·2025

Related Experiment Video

Updated: Dec 15, 2025

High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
07:55

High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis

Published on: September 22, 2017

10.5K

Mueller matrix ellipsometer using dual continuously rotating anisotropic mirrors.

Alexander Ruder, Brandon Wright, Darin Peev

    Optics Letters
    |July 8, 2020
    PubMed
    Summary

    This study demonstrates a novel Mueller matrix ellipsometer using rotating anisotropic mirrors for polarization control. The instrument accurately measures Mueller matrices of anisotropic samples, validating its performance.

    More Related Videos

    Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms
    08:48

    Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms

    Published on: September 25, 2020

    6.1K
    A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
    11:15

    A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors

    Published on: May 30, 2016

    25.9K

    Related Experiment Videos

    Last Updated: Dec 15, 2025

    High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
    07:55

    High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis

    Published on: September 22, 2017

    10.5K
    Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms
    08:48

    Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms

    Published on: September 25, 2020

    6.1K
    A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
    11:15

    A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors

    Published on: May 30, 2016

    25.9K

    Area of Science:

    • Optical physics
    • Materials science
    • Nanotechnology

    Background:

    • Ellipsometry is a powerful optical technique for characterizing materials.
    • Conventional ellipsometers often require complex optical components for polarization control.

    Purpose of the Study:

    • To demonstrate the calibration and operation of a novel Mueller matrix ellipsometer.
    • To utilize continuously rotating anisotropic mirrors as polarization state generators and analyzers.

    Main Methods:

    • A single wavelength (660 nm) Mueller matrix ellipsometer in a normal transmission configuration was developed.
    • Dual continuously rotating anisotropic mirrors with nanostructured titanium thin films on gold were employed.
    • A Fourier expansion approach was used for calibration and analysis of polarization modulation.

    Main Results:

    • The rotating mirrors effectively modulated the Stokes parameters of light.
    • The instrument successfully measured Mueller matrix elements of anisotropic samples (linear polarizer and retarder).
    • Experimental results showed very good agreement with model data.

    Conclusions:

    • The developed Mueller matrix ellipsometer with rotating anisotropic mirrors is a viable and accurate instrument.
    • This approach offers a simplified and effective method for polarization control in ellipsometry.
    • The nanostructured mirrors provide a robust solution for generalized ellipsometry applications.