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Updated: Dec 15, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Self-emitted surface corrugations in dynamic fracture of silicon single crystal
Meng Wang1, Marion Fourmeau1, Lv Zhao2,3
1Univ Lyon, Institut National des Sciences Appliquées (INSA)-Lyon, CNRS UMR5259, Laboratoire de Mécanique des Contacts et des Structures (LaMCoS), F-69621, France.
Abstract:
When a dynamic crack front travels through material heterogeneities, elastic waves are emitted, which perturb the crack and change the morphology of the fracture surface. For asperity-free crystalline materials, crack propagation along preferential cleavage planes is expected to present a smooth crack front and form a mirror-like fracture surface. Surprisingly, we show here that in single crystalline silicon without material asperities, the crack front presents a local kink during high-speed crack propagation. Meanwhile, local oscillations of the crack front, which can move along the crack front, emerge at the front kink position and generate periodic fracture surface corrugations. They grow from angstrom amplitude to a few hundred nanometers and propagate with a long lifetime at a frequency-dependent speed, while keeping a scale-independent shape. In particular, the local front oscillations collide in a particle-like manner rather than proceeding with a linear superposition upon interaction, which presents the characteristic of solitary waves. We propose that such a propagating mode of the crack front, which results from the fracture energy fluctuation at a critical crack speed in the silicon crystal, can be considered as nonlinear elastic waves that we call "corrugation waves."
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