Molecular Structure Modulated Trap Distribution and Carrier Migration in Fluorinated Epoxy Resin

Area of Science:

• Materials Science
• Electrical Engineering
• Computational Chemistry

Background:

• Surface charge accumulation on epoxy insulators poses a significant risk to the operational safety of direct current gas-insulated transmission lines (GIL).
• Surface modification technologies offer a promising approach to mitigate this issue.

Purpose of the Study:

• To investigate the mechanisms by which fluorination influences surface charge behavior in epoxy resin.
• To understand how molecular structure modifications affect charge dissipation and distribution.

Main Methods:

• Quantum chemical calculation (QCC) was employed to analyze the molecular structure of fluorinated epoxy resin.
• Carrier mobility models were utilized to further clarify the observed charge dissipation processes.

Main Results:

• Fluorination introduces shallow trap sites that accelerate surface charge dissipation.
• Distinct electron distribution patterns were observed for positively charged (HOMO) and negatively charged (LUMO) states.
• Electrons aggregated around benzene rings under positive charging and distributed along the epoxy chain under negative charging.

Conclusions:

• Fluorination effectively modulates surface charge behavior in epoxy resin by altering molecular structure and trap distribution.
• The study provides insights into the charging patterns and their dependence on molecular configurations.
• Surface modification via fluorination is a viable strategy for enhancing the performance and safety of GIL systems.